Metallography Laboratory

Analiz Adı: Sample Preparation and Etching
Within the structure of our center, in accordance with the requested analysis for iron and non-ferrous products, metallographic preparation and etching of the samples can be realized.
Devices  
Metkon MetaCut 251 Cutting
Metkon Forcipol 2V Mechanical Polishing
Struers LectroPol-5 Electrolytic Polishing and Etching

 

Analysis Name: Surface Roughness
Device Details
  •  Mitutoyo SJ-500                                                                                                                                                                                                                                                                                                                                        

    Click for technical specifications

Major Applications

  • Surface roughness measurement

Technicial Specifications

  • Only x-axis direction sequential tracking
  • X axis measurement length is max 50 mm
  • Applied weight is 2.7 kg
  • Speed ​​range is 0 – 20 mm/s
  • Types of analysis; Area, Circle, Angle, Coordinate difference, Step, Slope
  • Evaluation Parameters; Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),δc, mr, tp, Htp, Lo, lr, Ppi, HSC, Δa, Δq, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, λa, λq, R, AR, Rx, W, AW, Wx, Wte
Sample Features: The sample surfaces are parallel

 

Analysis Name: Corrosion Test
Device Details
  • IVIUM Vertex.EIS.1A/10V 

 

 

 

  Click for technical specifications

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Major Applications

  • Corrosion Test

Technicial Specifications

Potansiostat Specifications

  • Applied potential range 0.333mV, resolution ±10V
  • Applied potential accuracy 2mV
  • Current ranges from ±10nA to ±1A in nine stage
  • Measurable current resolution is minimum 15pA in 0.015% current range

Device’s Galvonastat Specifications

  • Applied current resolution %0,033
  • Applied current accuracy %0,2
  • Potential ranges ±10mV, ±100mV, ±1V, ±10V
  • Measured potential resolution 0.004%

Sweep Techniques

Transient Methods

Electroanalysis Techniques

Impedance Measurements

Corrosion Measurements

Sample Types: The minimum sample area is 1 cm2

 

Mikroscopy Laboratory

Analysis Name: Macro Structure Analysis
Devices Details
  • ZEISS Axio Lab. A1 inverted metallurgical microscope

 

 

          Click for technical specification

Major Applications

  • Phase analysis,
  • Grain size analysis
  • Inclusion analysis

Technicial Specifications

  • Contrast modules: Bright field, dark field, polarizing
  • LED lighting,
  • 2.1 MP CCD sensor camera
  • Apochromat optical system: 5X, 10X, 20X, 50X, 100X High-contrast Semi-Apochromat lenses
  • Single surface requirement with inverted optical system structure

Sample Types

  • Prepared as Macro
  • Cauterized

Analysis Detail

  •  Grain size counting and distribution,
  • Multiple phase detection and distribution,
  • Inoculant analysis,
  • Dark area,
  • Bright field works can be done.

 

 

 

 

 

 

 

 

 

  • Digital Microscope                                                                                                                                                                                                                                                                                                                                                                  
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-Brightfield (BF), darkfield (DF) and -POL contrast methods

-The device performs 3D scanning of the sample surface. It can make the measure length, angle, height, diameter, radius, rectangle, circle, polygon, area, distance, profile, volume, etc. on 2D and 3D surface profiles.

The device has,

• 0.5x/0.03 (FWD 78 mm) plan apochromatic objective lens,

• 1.6x/0.1 (FWD 36 mm) plan apochromatic objective lens,

• 5.0x/0.3 (FWD 30 mm) plan apochromatic objective lens,

•10.0x/0.6 (FWD 10 mm) plan apochromatic objective lens

The device has the following analysis modules:

• Grain size measurement according to ISO 643; ASTM E112 and ASTM E1382.

• Phase analysis and particle distribution module and Graphite module according to ISO 945.

• Comparative diagrams according to ISO 643; ASTME 112; Non-metallic content (NMI): ISO 4967; EN 10247, ASTM E45; DIN 50602, Graphite: ISO 945.

• Layer thickness measurement

• Confocal microscopy module for surface metrology, topography, roughness measurement according to ISO 25178 and ISO 4287.

The device shall have an off-the-shelf computer or all-in-one PC with manufacturer-recommended specifications and compatible with the firmware.

 

During the installation phase 
Sample Features: It must be metallographically prepared and soiled. 
Test Standards: ISO 4967,  EN 10247,  DIN 50602,  ASTM E45,  ISO 643,  DIN 50601,  ASTM 1382

 

Analysis Name: Microstructural Analysis and Elemental Analysis
Device Details

 

  • Hitachi SU3500 T2 Scanning Electron Microscobe (SEM)

 

  • Oxford XACT Electron Distribution Spectroscopy

 

Click for technical specification

 

Sample Types

  • Macro and micro-prepared samples
  • Unprepared samples
  • Conductive and non-conductive metal and non-metal materials

Major Applications

  • Iron and non-ferrous bulk / powder materials
  • Surface of ceramic, composite, polymer etc Materials
  • Sectional view
  • Dimension and shape characterization
  • Damage analysis
  • Display of microstructure up to 3 nm
  • Damage analysis
  • Inclusion analysis

Technicial Specifications

  • 30 kV power ratio
  • Pre-centered tungsten electron source
  • Topographic imaging with secondary electron detector
  • Composition with 5-segment back scattering (BSE) electron detector visualization
  • Low vacuum SE detector
  • 10 mm analytical working distance and 10 mm2 detector active area
  • 5 axis full automatic coffee table
  • X = 100 mm, Y = 50, T = 20◦ -90◦ , Z = 5-65 mm
  • Maximum sample dimensions 200 mm diameter 80 mm height

Analysis Detail

  • Ferrous and non-ferrous bulk / powder materials, Ceramics, Composite, Polymer etc. surface and section imaging of materials
  • Size and shape characterization
  • Damage analysis
  • Display of microstructure up to 3 nm
  • Inclusion analysis
  • Analysis and analysis up to 3 nm resolution (depending on sample suitability)
  • Low vacuum work
Sample Features: Surface and damage analysis can be done on the parts. Products for microstructure analysis should be metallographically prepared and (if necessary) etched.

 

Material Analysis Laboratory

Analysis Name: Spectral Analysis (OES)
Device Details

 

  • Thermo Scientific, ARL 3460 OES  

Click for Technical Specifications 

 

Major Applications

  • Elemental Analysis

Technicial Specifications

  • Stability, low analysis limits and accuracy.  
  • All aluminum alloys from ultra pure to high alloy can be analyzed with high precision (1/100000)
Sample Types: 
  • Clean and smooth surface
  • Minimum diameter for wire samples 3 mm

 

Analysis Name: Microhardness Test
Device Details
  • Shimadzu G21D      

  Click for Technical Specifications         

Sample Types

  • Simple crafted
  • Macro

Technicial Specifications

  • Micro-hardness measurements in the 1 - 2000 gr / f load range
  • 10X, 40X, 50X and 100X magnification lenses
  • Fracture toughness calculation
  • Sample thickness should be between 0.5 cm and 5 cm

Major Applications

  • Metallic materials
  • Coated materials
  • Heat treated surfaces and sections
  • Ceramics

Analysis Detail

  • Metallic materials, Coated materials, Heat treated surfaces and sections, For ceramics,
  • 1 g - 2000 g load sensitivity,
  • Hardness measurement with Vickers and Knoop methods,
  • Fracture Toughness (Kc) calculation.
Sample Features: It should be prepared metallographically.
Test Standarts: TS EN ISO 6507-1, TS EN ISO 4545-1, TS ISO 9385, TS 6503

 

Analysis Name: Universal Hardness Test
Device Details
  • Ernst AT250 Universal Hardness Tester

 

Click for Technical Specifications                                                                

​ Technicial Specifications

  • Rockwell and Brinell hardness measurement
  • Rosckwell Measurements: A-B-C scales, 60-100-150 kg can be done with the presented loads.
  • Brinell Measurements: HB5-HB10-HB30 scales, 62,5- It can be made with 125-187.5 loads.
  • Diamond taper end
  • 1/16, 2.5 and 5 round tip

Major Applications

  • Hardness measurement of aluminum materials
  • Hardness measurement in heat treated materials

Analysis Detail

  • Hardness measurement of aluminum materials
  • Hardness measurement in heat treated materials
  • Rockwell Measurements: A-B-C scales can be made with 60-100-150 kg loads.
  • Brinell Measurements: The HB5-HB10-HB30 scales can be made with loads of 62,5-125-187,5.
  • Unıversal Hardness Tester
 ​

-ISO 6506, ISO 6507, ISO 6508, ISO 4545, ASTM E10, ASTM E18 and ASTM E384 standartlarına uygun testler,

-Vickers, Knoop, Brinell and Rockwell

 

The device shall have each following indenters stated below:

  • 136° diamond Vickers indenter
  • 2.5 mm and/or 5mm ball Brinell indenter
  • 120° diamond Rockwell indenter

During the installation phase
Sample Features: Surfaces must be free from dust and dirt

Test Standards: TS EN ISO 6506,  TS EN ISO 6508,  ASTM E92,  ASTM E18

 

Analysis Name:  Tensile - Compression - 3 Point Bending Tests
Device Details
  •       ALSA 100kN

Electromechanical Device

 Click for Technical Specification        

 ​

Technicial Specifications

  • 100 kN (10 Tons), 50 mm clear extensometer
  • Replaceable jaws
  • 3-point bending test with 10-300 mm support spans

Apparatus

  • 0-150 mm pressing surface
  • Grips for flat samples 0-14 mm
  • Grips for 6-16 mm round specimens

Sample Types

  • Aluminum profiles
  • Steels up to 100 kN
  • Welded materials  

Major Applications

  • Flat materials
  • Bow tie samples
  • Full bars, empty bars (with apparatus)
  • Unshaped materials for compression (narrowest area learn)

Analysis Detail

  • 0 to 14 mm plate
  • 0 - up to 16 mm full and empty bar (provided with internal filling accessories)
  • Pressing surface up to 0 - 150 mm,
  • 3-point tilt test to flat products up to 10 - 300 mm (bearing clearance)
  • Pull Push 3 Point Tilt

The device can analyze in accordance with ISO 6892, ISO 7438 and ISO 9513 standards.

-100 KN capacity

- Wide range of tensile tests (-50 to +250 ºC)

-Extensometer analysis

 

During the installation phase

Sample Features:

  1. Samples for Tensile Testing shall be prepared in accordance with TS EN ISO 6892-1.
  2. For Sample Test (Sample Height = 1.5 x Sample Diameter).
Test Standards: TS EN ISO 6892-1,  TS 206,  TS 6936 EN 24506

 

Analysis Name: Thermo Gravimetry Analysis (TGA), Differential Scanner Calorimetry (DSC), Differential Thermal Analysis (DTA)

With the Discovery SDT 650, the weight change of the materials and the heat flow can be measured simultaneously as a function of temperature and / or time. Moisture, volatile components and additives can be determined for polymer and polymer composite 
Device Details
  • ​TA, Discovery SDT 650  

  Click for Technical Specifications

 ​

Major Applications

  • Melting point
  • Weight change
  • Phase transformation
  • Heat capacity (Cp) measurement (between ambient temperature and 1500 ° C
  • Glass transition, crystallization, degradation temperature
  • As content and additive quantity

Technicial Specifications

  • Furnace temperature reaching 1500° C (Temperature Calibration Curie Point (ASTM E1582)) 
  • Dynamic temperature accuracy ± 0,5 ° C
  • Heat speed (linear) 0.1 to 100 ° C / min
  • Calorimetric accuracy / accuracy ± 2%
    (according to metal standards)
  • Heat capacity accuracy ± 5%
  • Accuracy of ± 0.5%
  • Weighing accuracy ± 0.1%
  • Weight Base Line Shift [1]<50 μg
    to 1000° C and <50 μg
    1000 to 1500° C
  • Modulated DSC

​Sample Types

  • Solid materials

Sample weight is maximum 200 mg

 

 

Analysis Adı: 
Device Details
  • Tribometer                       

   

Analysis in accordance with ASTM G99 and ASTM G133 test standards

-Friction resolution 10 nm

-Wear test at temperatures above 400 °C

 

During the installation phase

Sample Features:
Test Standards: 

 

Analysis Adı: 
Device Details
  • ​Scratch Tester 

Ability to analyze in accordance with ISO 20502, ASTM C1624 and ASTM G171 standards

-80 N and above load cell

-5x, 20x, 50x magnification lenses are available.

-Rockwell C Diamond Bit, radius 50µm

-Rockwell C Diamond Tip has 200µm radius tips.

 

During the installation phase
Sample Features:
Test Standards: 

 

  • Brinell Hardness Tester Click here for technical specifications.
  • Click for technical specifications of Low Cycle Fatigue Testing Machine.
  • Click for technical specifications of High Cycle Fatigue Testing Machine.
  • Click here for technical specifications of Notch Impact Tester
  • Click for technical specifications of Chemical Analysis Tester.
  • Click here for technical specifications of Stereo Microscope.

*Services are provided under complementary infrastructures.

For Information and Communication;

0212 5218100 Ext: 4373

aluteamlab@fsm.edu.tr

Decision Rule:

Laboratory Coordinator makes evaluation for the methods requested by the customer. The applicability of the method or not can be notified to the customer by e-mail or in writing. Our laboratory only reports that it has yielded results and has no comments on the results in contracts with the customer.  It also states that it will not apply a decision rule in these contracts.

If the Customer requests a declaration of conformity for the test (for example, passed / passed, inside / out of tolerance), the customer will be informed that the declaration of conformity will not be given and an agreement is reached with the client.